Documentation/Nightly/Extensions/IASEM

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Introduction and Acknowledgements

Acknowledgments: This work is supported by NLM, and the Slicer Community.
Author: Bradley Lowekamp
Contact: Bradley Lowekamp <email>blowekamp@mail.nih.gov</email>
License: Apache License 2.0

The National Library of Medicine  
National Alliance for Medical Image Computing (NA-MIC)  


Extension Description

This extension is a compilation of modules which are useful for segmentation and processing of IASEM Electron Microscopy images. It adds modules which help in general with segmenting large data sets, and has components to deal with images in multi-resolutions.

IASEM stands for ion-abrasion scanning electron microscopy, some times also call dual-beam or focused ion-beam scanning electron microscopy (FIBSEM).

Modules

  • BinShrink ImageFilter
  • SpacingAwareCurvatureDiffusion Image Filter
  • DoubleThreshold Editor Effect
  • BinaryWatershed Editor Effect

Use Cases

Tutorials

Similar Extensions

N/A

References

Information for Developers