Documentation/Nightly/Extensions/IASEM

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Home < Documentation < Nightly < Extensions < IASEM


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Work in progress
 WARNING: This module is Work in Progress, which means:
  • the functionality provided by this module may change drastically in the future releases of 3D Slicer
  • the scenes containing data types specific to this module may not be readable by the future versions of Slicer
  • the functionality and user interface may change at any time
  • some functionality may not work as intended
  • testing and documentation is limited

Introduction and Acknowledgements

Acknowledgments: This work is supported by NLM, and the Slicer Community.
Author: Bradley Lowekamp
Contact: Bradley Lowekamp <email>blowekamp@mail.nih.gov</email>
License: Apache License 2.0

The National Library of Medicine  
National Alliance for Medical Image Computing (NA-MIC)  


Extension Description

This extension is a compilation of modules which are useful for IASEM Electron Microscopy. It add modules which help with segmenting large data sets, and has components to deal with images in multi-resolutions.

IASEM stands for ion-abrasion scanning electron microscopy, some times also call dual-beam or focused ion-beam scanning electron microscopy (FIBSEM).

Modules

  • BinShrink ImageFilter
  • SpacingAwareCurvatureDiffusion Image Filter
  • DoubleThreshold Editor Effect
  • BinaryWatershed Editor Effect


Use Cases

Tutorials

Similar Extensions

N/A

References

Information for Developers

Work in progress
 Section under construction.
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