Difference between revisions of "Documentation/Nightly/Extensions/IASEM"

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{{documentation/{{documentation/version}}/extension-section|Extension Description}}
 
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This extension is a compilation of modules which are useful for IASEM Electron Microscopy. It add modules which help with segmenting large data sets, and has components to deal with images in multi-resolutions.
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This extension is a compilation of modules which are useful for segmentation and processing of IASEM Electron Microscopy images. It adds modules which help in general with segmenting large data sets, and has components to deal with images in multi-resolutions.
  
 
IASEM stands for ion-abrasion scanning electron microscopy, some times also call dual-beam or focused ion-beam scanning electron microscopy (FIBSEM).  
 
IASEM stands for ion-abrasion scanning electron microscopy, some times also call dual-beam or focused ion-beam scanning electron microscopy (FIBSEM).  
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* DoubleThreshold Editor Effect
 
* DoubleThreshold Editor Effect
 
* BinaryWatershed Editor Effect
 
* BinaryWatershed Editor Effect
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Revision as of 15:30, 2 August 2013

Home < Documentation < Nightly < Extensions < IASEM


For the latest Slicer documentation, visit the read-the-docs.


Work in progress
 WARNING: This module is Work in Progress, which means:
  • the functionality provided by this module may change drastically in the future releases of 3D Slicer
  • the scenes containing data types specific to this module may not be readable by the future versions of Slicer
  • the functionality and user interface may change at any time
  • some functionality may not work as intended
  • testing and documentation is limited

Introduction and Acknowledgements

Acknowledgments: This work is supported by NLM, and the Slicer Community.
Author: Bradley Lowekamp
Contact: Bradley Lowekamp <email>blowekamp@mail.nih.gov</email>
License: Apache License 2.0

The National Library of Medicine  
National Alliance for Medical Image Computing (NA-MIC)  


Extension Description

This extension is a compilation of modules which are useful for segmentation and processing of IASEM Electron Microscopy images. It adds modules which help in general with segmenting large data sets, and has components to deal with images in multi-resolutions.

IASEM stands for ion-abrasion scanning electron microscopy, some times also call dual-beam or focused ion-beam scanning electron microscopy (FIBSEM).

Modules

  • BinShrink ImageFilter
  • SpacingAwareCurvatureDiffusion Image Filter
  • DoubleThreshold Editor Effect
  • BinaryWatershed Editor Effect

Use Cases

Tutorials

Similar Extensions

N/A

References

Information for Developers

Work in progress
 Section under construction.
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