Difference between revisions of "Documentation/Nightly/Extensions/IASEM"
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* DoubleThreshold Editor Effect | * DoubleThreshold Editor Effect | ||
Revision as of 14:07, 6 August 2013
Home < Documentation < Nightly < Extensions < IASEM
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For the latest Slicer documentation, visit the read-the-docs. |
Contents |
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WARNING: This module is Work in Progress, which means:
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Introduction and Acknowledgements
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Acknowledgments:
This work is supported by NLM, and the Slicer Community. | |||||
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Extension Description
This extension is a compilation of modules which are useful for segmentation and processing of IASEM Electron Microscopy images. It adds modules which help in general with segmenting large data sets, and has components to deal with images in multi-resolutions.
IASEM stands for ion-abrasion scanning electron microscopy, some times also call dual-beam or focused ion-beam scanning electron microscopy (FIBSEM).
Segmentation of Gold particles.
Modules
- BinShrink Image Filter
- SpacingAwareCurvatureDiffusion Image Filter
- DoubleThreshold Editor Effect
- BinaryWatershed Editor Effect
Use Cases
BinShrink Image Filter
SpacingAwareCurvatureDiffusion Image Filter
DoubleThreshold Editor Effect
BinaryWatershed Editor Effect
Tutorials
Similar Extensions
N/A
References
Information for Developers
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Section under construction. |
